Design Automation for Quantum Computing

In QDA (Design Automation for Quantum Computing) project in VeriQ, a series of QDA tools are developed, including a fault simulator based on tensor network and BDD, an ATPG (Automatic Test Pattern Generation) algorithm for testing quantum circuits, and a tensor network based decision diagram for representation of quantum circuits. These tools have a wide range of applications such as simulation, verification, synthesis, circuit testing and equivalence checking.


VeriQBench is a benchmark for general tasks in Quantum Computing. It includes the most commonly used types of quantum circuits — combinational quantum circuits, dynamic quantum circuits, sequential quantum circuits, and variational quantum circuits. For most of the quantum circuits, our benchmark includes three scales: small scale (<20 qubits), medium scale (20-50 qubits), and large scale (>50 qubits). We also provide a series of scrips for users to generate quantum circuits of arbitrary number of qubits.

See Github Repo

[1] Kean Chen, Wang Fang, Ji Guan, Xin Hong, Mingyu Huang, Junyi Liu, Qisheng Wang, and Mingsheng Ying. Veriqbench: A benchmark for multiple types of quantum circuits. arXiv preprint arXiv:2206.10880, 2022.

Fault Simulator

A fault simulation tool for noisy quantum circuits based on tensor network and BDD(binary decision diagram) method.

See Github Repo

ATPG (Automatic Test Pattern Generation)

An automatic test pattern generation (ATPG) algorithm for robust quantum circuit testing based on stabilizer projector decomposition.

See Github Repo

[2] Kean Chen and Mingsheng Ying. Automatic test pattern generation for robust quantum circuit testing. arXiv preprint arXiv:2202.10697, 2022.

TDD (Tensor Decision Diagram)

A tensor network based decision diagram for representation and operation of tensor networks and quantum circuits.

See Github Repo

[3] Xin Hong, Xiangzhen Zhou, Sanjiang Li, Yuan Feng, and Mingsheng Ying. A tensor network based decision diagram for representation of quantum circuits. ACM Trans. Des. Autom. Electron. Syst., 27(6), jun 2022. [ DOI | http ]